Development of head smut resistance -linked sequence characterized amplified regions markers in Sorghum

Li, Y. and Zou, J. and Ma, L. and Ma, C. and Li, X. and Lu, D. and Lu, S. and Hao, L. (2012) Development of head smut resistance -linked sequence characterized amplified regions markers in Sorghum. International Journal of Agriculture and Biology, 14 (4). pp. 613-616.

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Abstract

Head smut caused by Sporisorium reliamm (Kuhn) Clinton is a major limiting factor to Sorghum Yield. To Effectively screen to evaluate resistant varieties, we first developed sequences Characterized amplified regions (SCARs) marker tightly linked to head smut physiological race

Item Type: Article
Author Affiliation: Shenyang Normal University, China
Subjects: Crop Improvement
Divisions: Sorghum
Depositing User: Mr. SanatKumar Behera
Date Deposited: 13 Aug 2012 04:55
Last Modified: 13 Aug 2012 04:57
URI: http://eprints.icrisat.ac.in/id/eprint/7309

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