Kulkarni , N. and Shinde, V.K. (1985) Genetics of Grain Yield in Sorghum Under Striga Stress. The Indian Journal of Genetics and Plant Breeding, 45 (1). pp. 21-24.
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Abstract
Grain yield under striga infestation which provides a measure of field tolerance was estimated in a seven variety F1 and F2 diallel under two fertility levels. Heritability of yield was low under low fertility and moderate under normal fertility. Study of F1 crosses Indicated presence of overdominance for this character. CSV-8R and S-1841 were the good general combiners for grain yield under striga infestation
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | Sorghum bicolor, sorghum, Striga asiatica, striga disease tolerance, genetics. |
| Author Affiliation: | Sorghum Research Station, Marathwada Agricultural University, Parbhani |
| Subjects: | Crop Improvement |
| Divisions: | Sorghum |
| Depositing User: | Mr. SanatKumar Behera |
| Date Deposited: | 19 May 2012 08:54 |
| Last Modified: | 19 May 2012 08:55 |
| Official URL: | http://www.indianjournals.com/ijor.aspx?target=ijo... |
| URI: | http://eprints.icrisat.ac.in/id/eprint/5507 |
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