Jayaramachandran, M. and Kumaravadivel, N. and Eapen, Susan and Kandasamy, G.
(2010)
Gene Action for yield attributing characters in segregating generation (M2)
of Sorghum (Sorghum bicolor L.).
Electronic Journal of Plant Breeding, 1 (4 ).
pp. 802-805.
Abstract
Gamma rays was used as a physical mutagen to create variability and to study the gene action through mutation in Grain
sorghum variety CO(S) 28.The LD 50 for germination was observed as 35 kR and the treatment doses viz., 25 kR, 35 kR and
45 kR were fixed for creating variability. The M1 generation of all the three treatment doses was raised and selfed plants
were forwarded as M2 generation. Approximately 1500 M2 plants were raised in each treatment for recording observations.
The frequency distribution for the yield and yield attributing traits viz., panicle length, number of primary branches per
panicle, number of grains per panicle, 100 grain weight and grain yield per plant were obtained. The Skewness and Kurtosis
estimate were calculated to study the gene action. The traits viz., number of grains per panicle and grain yield per plant
recorded positive Skewness value in all the three irradiated doses. This indicates the presence of complementary epistatic
gene action for these traits and if selection will be made intensively in the segregating generations the gain will be faster and
mild selection resulted in slower gain.
Actions (login required)
 |
View Item |
![[img]](http://eprints.icrisat.ac.in/style/images/fileicons/application_pdf.png)
