Hill, J. and Wagoire, W.W. and Ortiz, R. and Stlen, O. (2000) Cross prediction in bread wheat germplasm using single seed descent lines. Euphytica, 113 (1). pp. 65-70.
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Abstract
Populations of F6 recombinant inbred lines, generated by single seed descent from a half diallel among eight bread wheat lines adapted to the East African highlands, were used to identify those crosses that were more likely to produce cultivars combining resistance to yellow rust (Puccinia striiformis) with improved yield. Crosses having the most resistant line as one parent offered the best prospect of success, particularly those which produced F1 hybrids exhibiting better parent heterosis. For plot grain yield there was a highly significant correlation between the observed and predicted rankings of the recombinant inbred line populations for the proportion of individual lines equalling or surpassing the target value. For yellow rust severity, however, this correlation was non-significant when a target value of zero was used. The adoption of a slightly less stringent target of 0.25, coupled with the omission of two aberrant populations, increased this correlation significantly. The plant breeding implications of these results are discussed
| Item Type: | Article |
|---|---|
| Author Affiliation: | Department of Agricultural Sciences, The Royal Veterinary and Agricultural University, 40 Thorvaldsenvej, DK-1871 Frederiksberg C, Copenhagen, Denmark |
| Subjects: | Crop Improvement > Genetics/Genomics Crop Improvement > Seed Technology |
| Divisions: | Other Crops |
| Depositing User: | Mr B Krishnamurthy |
| Date Deposited: | 14 Mar 2011 20:28 |
| Last Modified: | 14 Mar 2011 20:28 |
| Official URL: | http://dx.doi.org/10.1023/A:1003985429998 |
| URI: | http://eprints.icrisat.ac.in/id/eprint/1625 |
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