Goulding, F.S. and Jaklevic, J.M. (1973) Photon-Excited Energy-Dispersive X-Ray Fluorescence Analysis for Trace Elements. Annual Review of Nuclear Science, 23. pp. 45-74.
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Abstract
Like other methods devised to measure quantities of interest in basic physics, X-ray fluorescence spectroscopy is now becoming a tool of the analytical chemist. Semiconductor detectors that have contributed much of the experimental data on nuclear energy levels are proving equally valuable in measuring fluorescent X rays, and are so providing a versatile tool for rapid multielement analysis of many types of sample.
| Item Type: | Article |
|---|---|
| Author Affiliation: | Lawrence Berkeley Laboratory, University of California, Berkeley, California |
| Subjects: | Statistics and Experimentation > Experimentation |
| Divisions: | General |
| Depositing User: | Mr Siva Shankar |
| Date Deposited: | 10 Jun 2013 03:34 |
| Last Modified: | 10 Jun 2013 03:47 |
| Official URL: | http://dx.doi.org/10.1146/annurev.ns.23.120173.000... |
| URI: | http://eprints.icrisat.ac.in/id/eprint/10724 |
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